Description
Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
Product Details
- Published:
- 01/01/2000
- Number of Pages:
- 9
- File Size:
- 1 file , 280 KB
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ASTM F576-00
Original price was: $58.00.$29.00Current price is: $29.00.
Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
standard by ASTM International, 01/01/2000
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