1.1 This guide covers procedures for determining the energy-differential fluence spectra of neutrons used in radiation-hardness testing of electronic semiconductor devices. The types of neutron sources specifically covered by this guide are fission or degraded energy fission sources used in either a steady-state or pulse mode.

Product Details

Published:

12/01/2016

Number of Pages:

12

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1 file , 170 KB

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2 files , 340 KB