Description

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).

Product Details

Published:

12/01/2003

Number of Pages:

10

File Size:

1 file , 94 KB

Redline File Size:

2 files , 160 KB