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ASTM E3220-20

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ASTM E3220-20

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Standard Guide for Characterization of Graphene Flakes
standard by ASTM International, 04/01/2020

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Description

1.1 This standard will provide guidance on the measurement approaches for assessment of lateral flake size, average flake thickness, Raman intensity ratio of the D to G bands, and carbon/oxygen ratio for graphene and related products. The techniques included here are atomic force microscopy, Raman spectroscopy and X-ray photoelectron spectroscopy. Examples will be given for each type of measurement.

Product Details

Published:
04/01/2020
Number of Pages:
13
File Size:
1 file , 500 KB